Abstract of diploma thesis from Jork Leiterer
Title: Spectrophotometry and time-resolved Laser photometry for the VUV spectral range
Autor: Jork Leiterer; Friedrich-Schiller-University Jena, Faculty for Physics and Astronomy (FSU) and Fraunhofer Institute for Applied Optics and Precision Engineering Jena, Optical Coatings (IOF)
Summary: This work in technical physics describes the development and or build up of photometrical measurements to effectively characterise optical materials such as substrates and single and multilayer coatings. Due to the absorbing properties of air below wavelengths of 190nm, the apparatus must be set in a vacuum or cover gas making measuring a challenge. Accurate determination of photometrical data was demonstrated using the following selected substrates: fused silica, Mg F2, CaF2, BaF2, LiF and sapphire (Al2O3) and the data collected included reflection and transmission in a spectral range from 115 to 230 nm with an error of less than 0.1%. For the necessary in-situ-removal of surface contaminations (hydrocarbons) specific to each sample, an F2-laser was used, this laser was not only used as a cleaning tool but was furthermore integrated in a new time-resolved-measurement. Thereby, pulse-precise processes of cleaning were successfully observed and a theoretical model was created that well described their exponential progression.
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